Addressing Process Control Challenges in Big and Wide Data Environments

A number of unique issues must be solved when analyzing big and very high-dimensional data and/or big data with discrete variables of very high cardinality.

Download the whitepaper to learn about an architecture developed by TIBCO for a large semiconductor manufacturer for efficiently implementing these steps, in addition to real-world analytics use cases typically encountered in this industry.

Posted Date: June 10, 2019
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